Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

Servín, Manuel,

Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla. - First edition. - 1 online resource (xvi, 328 pages) : illustrations

Edition statement from running title area.

Includes bibliographical references and index.



1306840880 9781306840880 9783527681082 3527681086 3527411526 9783527411528 9783527681105 (ePub) 3527681108 (ePub)

615339 MIL


Interferometry.
Diffraction patterns.
Optical measurements.
SCIENCE--Energy.
SCIENCE--Mechanics--General.
SCIENCE--Physics--General.
Diffraction patterns.
Interferometry.
Optical measurements.
Interferometrie.
Beugungsfigur.


Electronic books.
Electronic books.

QC39 / .S384 2014

530.8