Advanced calculations for defects in materials : (Record no. 18794)

MARC details
000 -LEADER
fixed length control field 04784cam a2200565Ia 4500
001 - CONTROL NUMBER
control field ocn739118526
003 - CONTROL NUMBER IDENTIFIER
control field OCoLC
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220701010832.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS--GENERAL INFORMATION
fixed length control field m o d
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
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008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 110706s2011 gw a ob 001 0 eng d
040 ## - CATALOGING SOURCE
Original cataloging agency DG1
Language of cataloging eng
Description conventions pn
Transcribing agency DG1
Modifying agency CDX
-- E7B
-- OCLCQ
-- EUN
-- GZM
-- DEBSZ
-- OCLCQ
-- YDXCP
-- N$T
-- OCLCO
-- COO
-- OCLCQ
-- OCLCO
-- OCLCQ
-- OCLCO
-- DEBBG
019 ## -
-- 745970610
-- 747412455
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9783527638529
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 3527638520
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9783527638543
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 3527638547
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Cancelled/invalid ISBN 9783527410248
Qualifying information (hbk. ;
-- acid-free paper)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Cancelled/invalid ISBN 3527410244
Qualifying information (hbk. ;
-- acid-free paper)
024 8# - OTHER STANDARD IDENTIFIER
Standard number or code 9786613173652
029 1# - (OCLC)
OCLC library identifier AU@
System control number 000047774162
029 1# - (OCLC)
OCLC library identifier DEBSZ
System control number 372695973
029 1# - (OCLC)
OCLC library identifier NZ1
System control number 14146247
029 1# - (OCLC)
OCLC library identifier NZ1
System control number 15340673
029 1# - (OCLC)
OCLC library identifier DEBBG
System control number BV043393303
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)739118526
Canceled/invalid control number (OCoLC)745970610
-- (OCoLC)747412455
037 ## - SOURCE OF ACQUISITION
Stock number 10.1002/9783527638529
Source of stock number/acquisition Wiley InterScience
Note http://www3.interscience.wiley.com
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TA418.5
Item number .A38 2011
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC
Subject category code subdivision 021000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 620.1/1
Edition number 23
049 ## - LOCAL HOLDINGS (OCLC)
Holding library MAIN
245 00 - TITLE STATEMENT
Title Advanced calculations for defects in materials :
Remainder of title electronic structure methods /
Statement of responsibility, etc edited by Audrius Alkauskas [and others].
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc Weinheim :
Name of publisher, distributor, etc Wiley-VCH,
Date of publication, distribution, etc ©2011.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource (xviii, 384 pages) :
Other physical details illustrations
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Advances in Electronic Structure Methods for Defects and Impurities in Solids / Chris G Van de Walle, Anderson Janotti -- Accuracy of Quantum Monte Carlo Methods for Point Defects in Solids / William D Parker, John W Wilkins, Richard G Hennig -- Electronic Properties of Interfaces and Defects from Many-Body Perturbation Theory: Recent Developments and Applications / Matteo Giantomassi, Martin Stankovski, Riad Shaltaf, Myrta Gruning, Fabien Bruneval, Patrick Rinke, Gian-marco Rignanese -- Accelerating GW Calculations with Optimal Polarizability Basis / Paolo Umari, Xiaofeng Qian, Nicola Marzari, Geoffrey Stenuit, Luigi Giacomazzi, Stefano Baroni -- Calculation of Semiconductor Band Structures and Defects by the Screened Exchange Density Functional / S J Clark, John Robertson -- Accurate Treatment of Solids with the HSE Screened Hybrid / Thomas M Henderson, Joachim Paier, Gustavo E Scuseria -- Defect Levels Through Hybrid Density Functionals: Insights and Applications / Audrius Alkauskas, Peter Broqvist, Alfredo Pasquarello -- Accurate Gap Levels and Their Role in the Reliability of Other Calculated Defect Properties / Peter Deak, Adam Gali, B̀lint Aradi, Thomas Frauenheim -- LDA + U and Hybrid Functional Calculations for Defects in ZnO, SnO₂, and TiO₂ / Anderson Janotti, Chris G Van de Walle -- Critical Evaluation of the LDA + U Approach for Band Gap Corrections in Point Defect Calculations: The Oxygen Vacancy in ZnO Case Study / Adisak Boonchun, Walter R L Lambrecht -- Predicting Polaronic Defect States by Means of Generalized Koopmans Density Functional Calculations / Stephan Lany -- SiO₂ in Density Functional Theory and Beyond / L Martin-Samos, G Bussi, A Ruini, E Molinari, M J Caldas -- Overcoming Bipolar Doping Difficulty in Wide Gap Semiconductors / Su-Huai Wei, Yanfa Yan -- Electrostatic Interactions between Charged Defects in Supercells / Christoph Freysoldt, Jorg Neugebauer, Chris G Van de Walle -- Formation Energies of Point Defects at Finite Temperatures / Blazej Grabowski, Tilmann Hickel, Jorg Neugebauer -- Accurate Kohn-Sham DFT With the Speed of Tight Binding: Current Techniques and Future Directions in Materials Modelling / Patrick R Briddon, Mark J Rayson -- Green's Function Calculation of Hyperfine Interactions for Shallow Defects in Semiconductors / Uwe Gerstmann -- Time-Dependent Density Functional Study on the Excitation Spectrum of Point Defects in Semiconductors / Adam Gali -- Which Electronic Structure Method for The Study of Defects: A Commentary / Walter R L Lambrecht.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographical references and index.
588 0# -
-- Print version record.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Materials
General subdivision Defects
-- Mathematics.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Materials
General subdivision Testing
-- Mathematical models.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Semiconductors
General subdivision Materials
-- Testing.
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element TECHNOLOGY & ENGINEERING
General subdivision Material Science.
Source of heading or term bisacsh
655 #4 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Alkauskas, Audrius.
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Print version:
Title Advanced calculations for defects in materials.
Place, publisher, and date of publication Weinheim : Wiley-VCH, ©2011
International Standard Book Number 3527410244
Record control number (DLC) 2012359010
-- (OCoLC)682895142
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="http://dx.doi.org/10.1002/9783527638529">http://dx.doi.org/10.1002/9783527638529</a>
Public note Wiley Online Library
994 ## -
-- 92
-- DG1

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