TY  - BOOK
AU  - Servín,Manuel
AU  - Quiroga,J.Antonio
AU  - Padilla,J.Moisés
TI  - Fringe pattern analysis for optical metrology: theory, algorithms, and applications 
SN  - 1306840880
AV  - QC39 .S384 2014
U1  - 530.8 
PY  - 2014///]
CY  - Weinheim
PB  - Wiley-VCH
KW  - Interferometry
KW  - Diffraction patterns
KW  - Optical measurements
KW  - SCIENCE
KW  - Energy
KW  - bisacsh
KW  - Mechanics
KW  - General
KW  - Physics
KW  - fast
KW  - Interferometrie
KW  - gnd
KW  - Beugungsfigur
KW  - Electronic books
N1  - Edition statement from running title area; Includes bibliographical references and index; ps
UR  - http://dx.doi.org/10.1002/9783527681075
ER  -