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Non-parametric tests for complete data / Vilijandas Bagdonavičius, Julius Kruopis, Mikhail S. Nikulin.

By: Contributor(s): Material type: TextTextPublication details: London ; Hoboken, NJ : ISTE/Wiley, 2011.Description: 1 online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9781118557716
  • 1118557719
  • 9781848212695
  • 1848212690
Subject(s): Genre/Form: Additional physical formats: Print version.: Non-parametric tests for complete data.DDC classification:
  • 519.5 23
LOC classification:
  • QA278.8 .B34 2011
Online resources:
Contents:
Chi-Squared Tests -- Goodness-of-fit Tests Based on Empirical Processes -- Rank Tests -- Other Non-parametric Tests -- Appendices. Parametric Maximum Likelihood Estimators -- Notions from the Theory of Stochastic Processes.
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Chi-Squared Tests -- Goodness-of-fit Tests Based on Empirical Processes -- Rank Tests -- Other Non-parametric Tests -- Appendices. Parametric Maximum Likelihood Estimators -- Notions from the Theory of Stochastic Processes.

Includes bibliographical references and index.

Print version record.