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Full-field measurements and identification in solid mechanics / edited by Michel Grédiac, François Hild.

Contributor(s): Material type: TextTextSeries: Mechanical engineering and solid mechanics seriesPublication details: London : ISTE Ltd, 2013.Description: 1 online resource (xix, 476 pages) : illustrationsContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9781118576670
  • 1118576675
  • 9781848212947
  • 1848212941
  • 9781118578469
  • 1118578465
Subject(s): Genre/Form: Additional physical formats: Print version:: Full-field measurements and identification in solid mechanics.DDC classification:
  • 531.3 23
LOC classification:
  • TA342 .F855 2013eb
Online resources:
Contents:
Basics of Metrology and Introduction to Techniques / Andre Chrysochoos, Yves Surrel -- Photoelasticity / Fabrice Bremand, Jean-Christophe Dupre -- Grid Method, Moire and Deflectometry / Jerome Molimard, Yves Surrel -- Digital Holography Methods / Pascal Picart, Paul Smigielski -- Elementary Speckle Interferometry / Pierre Jacquot, Pierre Slangen, Dan Borza -- Digital Image Correlation / Michel Bornert, Francois Hild, Jean-Jose Orteu, Stephane Roux -- From Displacement to Strain / Pierre Feissel -- Introduction to Identification Methods / Marc Bonnet -- Parameter Identification from Mechanical Field Measurements using Finite Element Model Updating Strategies / Emmanuel Pagnacco, Anne-Sophie Caro-Bretelle, Patrick Ienny -- Constitutive Equation Gap / Stephane Pagano, Marc Bonnet -- Virtual Fields Method / Michel Grediac, Fabrice Pierron, Stephane Avril, Evelyne Toussaint, Marco Rossi -- Equilibrium Gap Method / Fabien Amiot, Jean-Noel Perie, Stephane Roux -- Reciprocity Gap Method / Stephane Andrieux, Huy Duong Bui, Andrei Constantinescu -- Characterization of Localized Phenomena / Jacques Desrues, Julien Rethore -- From Microstructure to Constitutive Laws / Jerome Crepin, Stephane Roux -- Thermographic Analysis of Material Behavior / Jean-Christophe Batsale, Andre Chrysochoos, Herve Pron, Bertrand Wattrisse.
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Includes bibliographical references and index.

Online resource; title from pdf information screen (Ebsco, viewed February 21, 2013).

Basics of Metrology and Introduction to Techniques / Andre Chrysochoos, Yves Surrel -- Photoelasticity / Fabrice Bremand, Jean-Christophe Dupre -- Grid Method, Moire and Deflectometry / Jerome Molimard, Yves Surrel -- Digital Holography Methods / Pascal Picart, Paul Smigielski -- Elementary Speckle Interferometry / Pierre Jacquot, Pierre Slangen, Dan Borza -- Digital Image Correlation / Michel Bornert, Francois Hild, Jean-Jose Orteu, Stephane Roux -- From Displacement to Strain / Pierre Feissel -- Introduction to Identification Methods / Marc Bonnet -- Parameter Identification from Mechanical Field Measurements using Finite Element Model Updating Strategies / Emmanuel Pagnacco, Anne-Sophie Caro-Bretelle, Patrick Ienny -- Constitutive Equation Gap / Stephane Pagano, Marc Bonnet -- Virtual Fields Method / Michel Grediac, Fabrice Pierron, Stephane Avril, Evelyne Toussaint, Marco Rossi -- Equilibrium Gap Method / Fabien Amiot, Jean-Noel Perie, Stephane Roux -- Reciprocity Gap Method / Stephane Andrieux, Huy Duong Bui, Andrei Constantinescu -- Characterization of Localized Phenomena / Jacques Desrues, Julien Rethore -- From Microstructure to Constitutive Laws / Jerome Crepin, Stephane Roux -- Thermographic Analysis of Material Behavior / Jean-Christophe Batsale, Andre Chrysochoos, Herve Pron, Bertrand Wattrisse.

Computer Science and Engineering