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Applied logistic regression. by Hosmer, David W | Lemeshow, Stanley | Sturdivant, Rodney X. Series: Wiley series in probability and statisticsEdition: Third edition / David W. Hosmer, Jr., PhD, Stanley Lemeshow, PhD, Rodney X. Sturdivant, PhD.Material type:  Text; Format:
available online
 ; Literary form:
Not fiction
Publisher: Hoboken, New Jersey : Wiley, [2013]Online access: Wiley Online Library Availability: No items available :
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Log-linear modeling : concepts, interpretation, and application / Alexander von Eye, Michigan State University, Department of Psychology, East Lansing, MI, Eun-Young Mun, Rutgers, the State University of New Jersey, Center for Alcohol Studies, Piscataway, New Jersey. by Eye, Alexander von | Mun, Eun Young. Material type: Text; Format:
available online
; Literary form:
Not fiction
Publication details: Hoboken, New Jersey : Wiley, [2013]Online access: Wiley Online Library Availability: No items available :
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