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Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla.

By: Contributor(s): Material type: TextTextPublisher: Weinheim : Wiley-VCH, [2014]Copyright date: ©2014Edition: First editionDescription: 1 online resource (xvi, 328 pages) : illustrationsContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 1306840880
  • 9781306840880
  • 9783527681082
  • 3527681086
  • 3527411526
  • 9783527411528
  • 9783527681105 (ePub)
  • 3527681108 (ePub)
Subject(s): Genre/Form: Additional physical formats: Print version:: Fringe pattern analysis for optical metrology.DDC classification:
  • 530.8
LOC classification:
  • QC39 .S384 2014
Online resources:
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Edition statement from running title area.

Includes bibliographical references and index.

Online resource; title from PDF title page (Wiley, viewed August 1, 2014).

Physical Science